粉粒体評価
高分解能 粒度分布測定装置
BI-XDCは低エネルギーX線ビームを介して沈降検出を使用しており、無機試料材料の粒径を測定するために設計されています。これは、X線信号が散在しか吸収されないという極めて短い波長に起因する2つの重要な利点を提供しています。したがって全く三重補正は分布値を取得する必要はありません。追加の重力モードは最大100ミクロン以下10nmからサイズの範囲を拡大します。
•Accurate and quantitative
•Resolves mixtures
•X-ray detection - no optical corrections
•Range 10nm to 100m
•Scanning head for high speed
•Simple operation
•Clear text and graphical reports
Size Range: 0.01-100 microns, depends on particle and liquid density and liquid viscosity
Centrifuge Speed: 500-6000 rpm, +/-0.01%, high speed disc available see options
Disc: PMMA construction, 10-30 mL volume, solvent resistant disc available see options
Scanning Speed: 0.05-10 mm/min, 1 mm/min typical
Measurement Time: 3-30 min, typically 8 min/decade in particle diameter,
Data System: High-performance Windows™ system with color printer. Contact factory for latest specifications
Software: Written for Windows™, control, archiving and data analysis,
Power Requirements: 100/115/240 VAC, 50/60 Hz, 300 Watts,
Dimensions: 230(H) x 460(W) x 600(D), mm
Weight: 35 kgs
Environment: No special requirements. Bench top installation, quiet, no water or air handling needed. Suitable for use either in a laboratory or in many production environments.
Certifications: CE Marked
The versatile BI-XDC offers high resolution results to particle sizing problems where the particles are dispersed in a liquid and cover the size range from 0.01 to 30 microns. This range is useful for a variety of materials and many applications:
Abrasives
Inorganic pigments
Catalysts
Metal oxides
Cements
Metal powders
Ceramics
Clays
Minerals