BI-XDC

X線透過式-ディスク遠心沈降粒度分布測定装置

高分解能 粒度分布測定装置

BI-XDCは低エネルギーX線ビームを介して沈降検出を使用しており、無機試料材料の粒径を測定するために設計されています。これは、X線信号が散在しか吸収されないという極めて短い波長に起因する2つの重要な利点を提供しています。したがって全く三重補正は分布値を取得する必要はありません。追加の重力モードは最大100ミクロン以下10nmからサイズの範囲を拡大します。

•Accurate and quantitative

•Resolves mixtures

•X-ray detection - no optical corrections

•Range 10nm to 100m

•Scanning head for high speed

•Simple operation

•Clear text and graphical reports

Specifications

Size Range: 0.01-100 microns, depends on particle and liquid density and liquid viscosity

Centrifuge Speed: 500-6000 rpm, +/-0.01%, high speed disc available see options

Disc: PMMA construction, 10-30 mL volume, solvent resistant disc available see options

Scanning Speed: 0.05-10 mm/min, 1 mm/min typical

Measurement Time: 3-30 min, typically 8 min/decade in particle diameter,

Data System: High-performance Windows™ system with color printer. Contact factory for latest specifications

Software: Written for Windows™, control, archiving and data analysis,

Power Requirements: 100/115/240 VAC, 50/60 Hz, 300 Watts,

Dimensions: 230(H) x 460(W) x 600(D), mm

Weight: 35 kgs

Environment: No special requirements. Bench top installation, quiet, no water or air handling needed. Suitable for use either in a laboratory or in many production environments.

Certifications: CE Marked

Typical Applications

The versatile BI-XDC offers high resolution results to particle sizing problems where the particles are dispersed in a liquid and cover the size range from 0.01 to 30 microns. This range is useful for a variety of materials and many applications:

Abrasives

Inorganic pigments

Catalysts

Metal oxides

Cements

Metal powders

Ceramics

Clays

Minerals